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Press Release -- November 11th, 2025
Source: anritsu
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ANRITSU Publishes Anritsu Technical Review No. 33(English Edition of Japanese Issue No. 100)

A compass pointer to technologies and insights for the next 100 years

ANRITSU CORPORATION has published Anritsu Technical Review No. 33, the English edition of the 100th issue in Japanese.

Launched in Japan in 1957, Anritsu Technical has continually shared cutting-edge research papers centered on communications measurement technologies, serving as a ‘knowledge platform’ for researchers and engineers inside and outside the company. The English edition has also been published for more than 30 years, and we invite you to read this issue.

Marking this significant milestone of the 100th Japanese issue, Hanako Noda, Executive Director, CTO, and Head of the Advanced Technology Research Institute, commented, “The measurement technologies Anritsu has honed are used widely across fields including communications, inspection of food and pharmaceuticals, and energy management, helping resolve social challenges. In the era of AI and big data, accurate data acquisition is more important than ever, and we believe the role of our technologies will continue growing.

Even technologies and ideas that appear to belong to different fields can connect through the common foundation of ‘measurement,’ creating new value. Taking the publication of the 100th issue as an opportunity, we will accelerate challenges beyond conventional frameworks as we look toward the next 100 years.”

The inaugural issue featured then state-of-the-art technologies such as shortwave receivers and direction finders. Carrying that pioneering spirit forward, the 100th issue highlights leading-edge technologies that will underpin future society, including high-frequency communications for 6G and IOWN, inspection technologies that fuse AI and sensing for food and pharmaceuticals, next-generation devices leveraging graphene, and innovations in the field of energy control.

https://www.anritsu.com/en-us/about-anritsu/r-d/technical-review

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