01/30/2024
Global Test Leader to Demonstrate Innovative PCIe 6.0 Measurement Solution; Lead Technical Talks on Verifying High-speed Designs to Advance Next-Gen Technologies
Santa Clara, CA – January 26, 2024 – Anritsu Company (booth #605) will address the latest high-speed technology designs and signal integrity testing solutions to verify their performance throughout the DesignCon Conference, January 30 – February 1 in Santa Clara, CA. Included in the Anritsu booth will be live demonstrations of the world’s first PCIe Express® 6.0 Link Training functionality and a 4-port 70 GHz differential vector network analyzer (VNA) system. Anritsu will also host technical sessions on emerging technologies used by chip, board, and systems design engineers when developing next-generation high-speed products.
Live Demonstrations
Headlining the live booth demonstrations will be the Anritsu Signal Quality Analyzer-R MP1900A performing a Link Training function for PCIe 6.0 with the newly developed 32 Gbaud NRZ/PAM4 Re-Driver MU196060A. It is part of the Signal Quality Analyzer-R MP1900A’s support of PCIe 6.0 Card Electromechanical (CEM) specification and Base Specification.
Anritsu’s leadership in PCIe analysis will also be shown in the Tektronix booth (#827). The MP1900A BERT will be part of a PCI 6.0 Tx automated test solution along with Tektronix and Marvell Technology that supports 64 GT/s. Anritsu’s industry-leading BERT will also be paired with Tektronix and Synopsys solutions to conduct pathfinding 128 GT/s measurements that meet the PCIe 7.0 Base Specification.
Anritsu will also demonstrate how to accurately characterize high-speed interconnects, printed circuit boards (PCBs), backplanes, fixtures, packages, and probes for signal integrity to 70 GHz using the VectorStar™ VNA. Among the topics to be covered are measuring single-ended, balanced differential, and mixed-mode S-Parameters; profiling impedance along a line using Time Domain Reflectometry (TDR); and simulating the eye diagram for a high-speed channel. Performing accurate network extraction for fixture de-embedding will be shown, as well.
VectorStar, along with the ShockLine™ 4-port VNAs will be in the Signal Microwave DesignCon booth (#1341). The Anritsu VNAs will be part of differential PCB probing and signal integrity measurement demonstrations that highlight how to obtain superior measurement accuracy using advanced interconnect de-embedding techniques.
Technical Panel and Sessions
Anritsu Sr. Business Development Manager Hiroshi Goto will participate in The Case of the Closing Eyes: Linear Drive, the 100G & the 200G per Lane technical panel on Tuesday, January 30 at 4:45 p.m. in Ballroom E. He will be part of a discussion on the challenges of 100G and 200G PAM4 per lane. Goto and other panel members will explain the key signal integrity and verification challenges and how they will be solved through advanced test solutions.
Anritsu will also host educational sessions on Wednesday, January 31, in Great America 3 ballroom. The schedule includes:
9:00 a.m. – 9:45 a.m.: PCI Express 6.0 CEM Pathfinding Updates.
This talk by David Bouse, Principal Technology Leader, Tektronix, delves into the forefront of PCIe 6.0 CEM pathfinding. It will involve a comprehensive examination of Signal-to-Noise and Distortion Ratio (SNDR), Random and Deterministic Jitter (RLM), and the impact of uncorrelated jitter as these measurements are explored with higher channel losses.
11:15 a.m. – 12:00 p.m.: Embracing the Power of PCIe 6.0, with a Focus on Anritsu’s State-of-the-Art Test Solutions.
Goto will discuss the PCIe 6.0 standard. He will also provide a receiver compliance test overview and highlight Anritsu’s new PCIe 6.0 test solution.
2:15 p.m. – 3:00 p.m.: Thunderbolt™ 5, USB4® Version 2.0, DisplayPort™ 2.1, USB 3.2 – Latest in Signal Integrity and Tx/Rx Compliance Test Methods for all things USB Type-C®
Mike Engbretson, Product Marketing Manager, Teledyne LeCroy will demonstrate Thunderbolt 5 (USB4 Version 2.0 specification) PAM3 signals coming from the MP1900A BERT, with LeCroy’s new SDA8000HD 12-bit oscilloscope. The SDA8000HD oscilloscope provides the highest SNDR, lowest Jitter, and highest resolution for eye diagram testing on the market for 80Gb/s PAM3 signals used in the USB4 Version 2.0 specification and 64GT/s PAM4 signals used in PCI Express 6.0.
3:15 p.m. – 4:00 p.m.: Signal Integrity Testing with Anritsu Vector Network Analyzers
This session will focus on PCIe and different cables for signal integrity testing. It will incorporate the ShockLine® 4-port VNA that supports 45.3 GHz, and the VectorStar VNA that covers 70 kHz to 70 GHz and beyond. Additionally, test support for next-generation applications, such as PCIe 6.0 and 7.0, will be discussed by presenter Navneet Kataria, Anritsu Product Marketing Manager.
About Anritsu
Anritsu is a provider of innovative communications test and measurement solutions. Anritsu engages customers as true partners to help develop wireless, optical, microwave/RF, and digital solutions for R&D, manufacturing, installation, and maintenance applications, as well as multidimensional service assurance solutions for network monitoring and optimization. Anritsu also provides precision microwave/RF components, optical devices, and high-speed electrical devices for communication products and systems. The company develops advanced solutions for emerging and legacy wireline and wireless technologies used in commercial, private, military/aerospace, government, and other markets.
To learn more visit www.anritsu.com and follow Anritsu on Facebook, LinkedIn, Twitter, and YouTube.
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